Atomic force microscopy as a tool in asphalt research

 

محفوظ في:
التفاصيل البيبلوغرافية
المؤلفون: García, Adriana, Kikut Cruz, Karina
التنسيق: artículo original
الحالة:Versión publicada
تاريخ النشر:2020
الوصف:The Atomic Force Microscope is used to obtain superficial images with high resolution. As well, to acquire information about the mechanical properties of a material. This tool has several operation modes, such as static, dynamic, tapping and contact, among others. It is worth to mention that cantilever has several geometries, then choosing the right one is a crucial step in any investigation that uses AFM. The focus of this article is to give a broad outlook of the AFM, from its operation modes to its applications in asphalt studies. Upon this article, the AFM is highly used in asphalts to analyse the microscopic properties and to understand how these properties impact its macroscopic performance.  
البلد:Portal de Revistas UCR
المؤسسة:Universidad de Costa Rica
Repositorio:Portal de Revistas UCR
اللغة:Español
OAI Identifier:oai:portal.ucr.ac.cr:article/42057
الوصول للمادة أونلاين:https://revistas.ucr.ac.cr/index.php/vial/article/view/42057
Access Level:acceso abierto
كلمة مفتاحية:Atomic Force Microscope
asphalt
microscopic properties
operation modes
cantilever
Microscopio de fuerza atómica
asfalto
propiedades microscópicas
modos de operación