Atomic force microscopy as a tool in asphalt research
में बचाया:
| लेखकों: | , |
|---|---|
| स्वरूप: | artículo original |
| स्थिति: | Versión publicada |
| प्रकाशन तिथि: | 2020 |
| विवरण: | The Atomic Force Microscope is used to obtain superficial images with high resolution. As well, to acquire information about the mechanical properties of a material. This tool has several operation modes, such as static, dynamic, tapping and contact, among others. It is worth to mention that cantilever has several geometries, then choosing the right one is a crucial step in any investigation that uses AFM. The focus of this article is to give a broad outlook of the AFM, from its operation modes to its applications in asphalt studies. Upon this article, the AFM is highly used in asphalts to analyse the microscopic properties and to understand how these properties impact its macroscopic performance. |
| देश: | Portal de Revistas UCR |
| संस्थान: | Universidad de Costa Rica |
| Repositorio: | Portal de Revistas UCR |
| भाषा: | Español |
| OAI Identifier: | oai:portal.ucr.ac.cr:article/42057 |
| ऑनलाइन पहुंच: | https://revistas.ucr.ac.cr/index.php/vial/article/view/42057 |
| Access Level: | acceso abierto |
| संकेत शब्द: | Atomic Force Microscope asphalt microscopic properties operation modes cantilever Microscopio de fuerza atómica asfalto propiedades microscópicas modos de operación |