Atomic force microscopy as a tool in asphalt research

 

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Библиографические подробности
Авторы: García, Adriana, Kikut Cruz, Karina
Формат: artículo original
Статус:Versión publicada
Дата публикации:2020
Описание:The Atomic Force Microscope is used to obtain superficial images with high resolution. As well, to acquire information about the mechanical properties of a material. This tool has several operation modes, such as static, dynamic, tapping and contact, among others. It is worth to mention that cantilever has several geometries, then choosing the right one is a crucial step in any investigation that uses AFM. The focus of this article is to give a broad outlook of the AFM, from its operation modes to its applications in asphalt studies. Upon this article, the AFM is highly used in asphalts to analyse the microscopic properties and to understand how these properties impact its macroscopic performance.  
Страна:Portal de Revistas UCR
Институт:Universidad de Costa Rica
Repositorio:Portal de Revistas UCR
Язык:Español
OAI Identifier:oai:portal.ucr.ac.cr:article/42057
Online-ссылка:https://revistas.ucr.ac.cr/index.php/vial/article/view/42057
Access Level:acceso abierto
Ключевое слово:Atomic Force Microscope
asphalt
microscopic properties
operation modes
cantilever
Microscopio de fuerza atómica
asfalto
propiedades microscópicas
modos de operación