Atomic force microscopy as a tool in asphalt research

 

Sparad:
Bibliografiska uppgifter
Författarna: García, Adriana, Kikut Cruz, Karina
Materialtyp: artículo original
Status:Versión publicada
Utgivningstid:2020
Beskrivning:The Atomic Force Microscope is used to obtain superficial images with high resolution. As well, to acquire information about the mechanical properties of a material. This tool has several operation modes, such as static, dynamic, tapping and contact, among others. It is worth to mention that cantilever has several geometries, then choosing the right one is a crucial step in any investigation that uses AFM. The focus of this article is to give a broad outlook of the AFM, from its operation modes to its applications in asphalt studies. Upon this article, the AFM is highly used in asphalts to analyse the microscopic properties and to understand how these properties impact its macroscopic performance.  
Land:Portal de Revistas UCR
Organisation:Universidad de Costa Rica
Repositorio:Portal de Revistas UCR
Språk:Español
OAI Identifier:oai:portal.ucr.ac.cr:article/42057
Länkar:https://revistas.ucr.ac.cr/index.php/vial/article/view/42057
Access Level:acceso abierto
Nyckelord:Atomic Force Microscope
asphalt
microscopic properties
operation modes
cantilever
Microscopio de fuerza atómica
asfalto
propiedades microscópicas
modos de operación