Ramírez Porras, A., Fonseca, L. F., & Resto, O. (2003). Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films.
استشهاد بنمط شيكاغوRamírez Porras, Arturo, L. F. Fonseca, و O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.
MLA استشهادRamírez Porras, Arturo, L. F. Fonseca, و O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.