Ramírez Porras, A., Fonseca, L. F., & Resto, O. (2003). Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films.
Chicago Style CitationRamírez Porras, Arturo, L. F. Fonseca, and O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.
MLA CitationRamírez Porras, Arturo, L. F. Fonseca, and O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.
Warning: These citations may not always be 100% accurate.