Ramírez Porras, A., Fonseca, L. F., & Resto, O. (2003). Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films.
Style de citation ChicagoRamírez Porras, Arturo, L. F. Fonseca, et O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.
Style de citation MLARamírez Porras, Arturo, L. F. Fonseca, et O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.
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