Deismireacht APA

Ramírez Porras, A., Fonseca, L. F., & Resto, O. (2003). Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films.

Citación estilo Chicago

Ramírez Porras, Arturo, L. F. Fonseca, y O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.

Deismireacht MLA

Ramírez Porras, Arturo, L. F. Fonseca, y O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.

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