Cita APA

Ramírez Porras, A., Fonseca, L. F., & Resto, O. (2003). Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films.

Citación estilo Chicago

Ramírez Porras, Arturo, L. F. Fonseca, y O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.

Cita MLA

Ramírez Porras, Arturo, L. F. Fonseca, y O. Resto. Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films. 2003.