Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films
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| Autoři: | , , |
|---|---|
| Médium: | artículo original |
| Datum vydání: | 2003 |
| Popis: | A stochastic distribution of nanocrystalline sizes model is applied to fit photoluminescence (PL) spectra of luminescent Si nanocrystals in a Si/SiO2 matrix synthesized by RF co-sputtering on the top of quartz substrates. With this method, the PL spectra from a diverse set of samples can be resolved mainly as the sum of two components: a contribution from a gaussian-like distribution of sizes of quantum dots (QD) and a similar component from a distribution of quantum wires (QW). These distributions of sizes and their associated PL energies agree well with the so-called Smart Quantum Confinement model (SQC). |
| Země: | Kérwá |
| Instituce: | Universidad de Costa Rica |
| Repositorio: | Kérwá |
| OAI Identifier: | oai:kerwa.ucr.ac.cr:10669/329 |
| On-line přístup: | http://www.mrs.org/s_mrs/sec_subscribe.asp?CID=2555&DID=117919&action=detail https://hdl.handle.net/10669/329 |
| Klíčové slovo: | Silicio poroso Confinamiento cuántico |