Thermal conductivity of GeSn alloys: a CMOS candidate for energy harvesting applications
Enregistré dans:
| Auteurs: | , , , , , |
|---|---|
| Format: | artículo original |
| Statut: | Versión publicada |
| Date de publication: | 2024 |
| Description: | The thermal conductivity, κ, of thin GeSn semiconductors with Sn concentration of 12 at.% was studied by the 3-omega method. Accent is put on room temperature characterization where a small lattice conductivity of 4.5W/m-K was extracted. Similar performance was found but using the Raman thermometry optical method indicating the reliability of the measurements and showing GeSn alloys as promising materials for thermoelectric applications. |
| Pays: | Portal de Revistas TEC |
| Institution: | Instituto Tecnológico de Costa Rica |
| Repositorio: | Portal de Revistas TEC |
| Langue: | Inglés |
| OAI Identifier: | oai:ojs.pkp.sfu.ca:article/7218 |
| Accès en ligne: | https://revistas.tec.ac.cr/index.php/tec_marcha/article/view/7218 |
| Mots-clés: | Thermoelectrics GeSn thermal conductivity 3-omega method characterization thin films termoeléctrico conductividad térmica método 3-omega caracterización películas delgadas |