Thermal conductivity of GeSn alloys: a CMOS candidate for energy harvesting applications

 

שמור ב:
מידע ביבליוגרפי
Autores: Tiscareño Ramirez, Jhonny, Gallardo Hernandez, Salvador, Krause, Oliver, Concepción, Omar, Grützmacher, Detlev, Buca, Dan
פורמט: artículo original
סטטוס:Versión publicada
Fecha de Publicación:2024
תיאור:The thermal conductivity, κ, of thin GeSn semiconductors with Sn concentration of 12 at.% was studied by the 3-omega method. Accent is put on room temperature characterization where a small lattice conductivity of 4.5W/m-K was extracted. Similar performance was found but using the Raman thermometry optical method indicating the reliability of the measurements and showing GeSn alloys as promising materials for thermoelectric applications.
País:Portal de Revistas TEC
מוסד:Instituto Tecnológico de Costa Rica
Repositorio:Portal de Revistas TEC
שפה:Inglés
OAI Identifier:oai:ojs.pkp.sfu.ca:article/7218
גישה מקוונת:https://revistas.tec.ac.cr/index.php/tec_marcha/article/view/7218
מילת מפתח:Thermoelectrics
GeSn
thermal conductivity
3-omega method
characterization
thin films
termoeléctrico
conductividad térmica
método 3-omega
caracterización
películas delgadas