Ramírez-Porras, A. (2011). Nanostructure size determination in N+- type porous silicon bY X-Rya diffractometry and Raman Spectroscopy.
استشهاد بنمط شيكاغوRamírez-Porras, A. Nanostructure Size Determination in N+- Type Porous Silicon BY X-Rya Diffractometry and Raman Spectroscopy. 2011.
MLA استشهادRamírez-Porras, A. Nanostructure Size Determination in N+- Type Porous Silicon BY X-Rya Diffractometry and Raman Spectroscopy. 2011.
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