Ramírez-Porras, A. (2011). Nanostructure size determination in N+- type porous silicon bY X-Rya diffractometry and Raman Spectroscopy.
Dyfyniad Arddull ChicagoRamírez-Porras, A. Nanostructure Size Determination in N+- Type Porous Silicon BY X-Rya Diffractometry and Raman Spectroscopy. 2011.
Dyfyniad MLARamírez-Porras, A. Nanostructure Size Determination in N+- Type Porous Silicon BY X-Rya Diffractometry and Raman Spectroscopy. 2011.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.