Atomic force microscopy as a tool in asphalt research

 

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Detalles Bibliográficos
Autores: García, Adriana, Kikut Cruz, Karina
Formato: artículo original
Estado:Versión publicada
Fecha de Publicación:2020
Descripción:The Atomic Force Microscope is used to obtain superficial images with high resolution. As well, to acquire information about the mechanical properties of a material. This tool has several operation modes, such as static, dynamic, tapping and contact, among others. It is worth to mention that cantilever has several geometries, then choosing the right one is a crucial step in any investigation that uses AFM. The focus of this article is to give a broad outlook of the AFM, from its operation modes to its applications in asphalt studies. Upon this article, the AFM is highly used in asphalts to analyse the microscopic properties and to understand how these properties impact its macroscopic performance.  
País:Portal de Revistas UCR
Institución:Universidad de Costa Rica
Repositorio:Portal de Revistas UCR
Lenguaje:Español
OAI Identifier:oai:portal.ucr.ac.cr:article/42057
Acceso en línea:https://revistas.ucr.ac.cr/index.php/vial/article/view/42057
Palabra clave:Atomic Force Microscope
asphalt
microscopic properties
operation modes
cantilever
Microscopio de fuerza atómica
asfalto
propiedades microscópicas
modos de operación