Chemical and Microscopy Characterization of Trans-Endodontic Implants
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Författarna: | , , , , , |
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Materialtyp: | artículo original |
Status: | Versión publicada |
Utgivningstid: | 2018 |
Beskrivning: | Trans-endodontic implants are an artificial extension through root apex anchored in periradicular bone tissue. The aim is to improve the crown-root ratio and to provide stability to dental organ present. Zirconium oxide (ZrO2) is a material of great technological importance, having good natural color, high strength, high toughness, high chemical stability, does not suffer any corrosion, chemical and microbial resistance and excellent esthetic properties. Objective: The aim of this study was to evaluate chemical and microscopy of surface conditions of ZrO2 trans-endodontic implant. Materials and Methods: A blocks of ZrO2 were manufactured for produce trans-endodontic implants and divided in two groups: monoclinic and tetragonal phase. They were evaluated using Scanning Electroning Microscope (SEM), Energy-Dispersive X-ray Spectroscopy (EDS), and Atomic Force Microscope (AFM) and Vickers Micro hardness. Results: The Monoclinic phase through AFM analysis showed roughness Ra = 0.320μm, whereas in the Tetragonal phase was 0.126μm, SEM/EDX indicated that the phases are not properly uniform and the addition of the Yttrium to favor the stabilization of the Tetragonal phase. The Vickers hardness analysis showed a value of 1500HV. Conclusion: The characterization of the surface of trans-endodontic zirconium oxide implants provides a guideline to know the surface characteristics of the material, since a greater roughness on the surface of the implant will favor the Osseo-integration capacity. |
Land: | Portal de Revistas UCR |
Organisation: | Universidad de Costa Rica |
Repositorio: | Portal de Revistas UCR |
Språk: | Inglés |
OAI Identifier: | oai:portal.ucr.ac.cr:article/30282 |
Länkar: | https://revistas.ucr.ac.cr/index.php/Odontos/article/view/30282 |
Nyckelord: | Trans-endodontic implants Zirconium oxide Scanning electron microscope (SEM) Energy-dispersive X-ray spectroscopy (EDS) Atomic force microscope (AFM) Vickers hardness |